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Host tests that compile the production variant files (TLoraPagerBoard.cpp, PagerHaptics.cpp, PagerImu.cpp from #748-#751) against register-level fakes of the BQ25896, BQ27220, DRV2605 and BHI260AP (test/pager_hw_fakes/): - test_pager_power: REG0B decoding (USB host, adapter, power-good alone, OTG not counted as USB, the 1 s cache), the temperature guard with its 3 C band, user limits and implausible readings, battery care 80/75 %, both holds through the one charger switch, charge limits rounded to the chip's 64 mA / 16 mV steps, the gauge capacity written once per target (a sealed gauge is left alone on later boots), and ship mode refused on USB, read afresh, BATFET_DLY cleared and BATFET_DIS set on battery. - test_pager_haptics: the waveform slots of every pattern and strength, all eight slots rewritten, standby only after GO clears, no bus traffic without the chip. - test_pager_imu: one firmware upload per boot at 1 MHz with the bus clock put back, scaling to g, stale samples refused, the 3 s idle stop and restart, no retry storm after a failed upload. Each was checked against a mutated copy of its subject (hysteresis removed, care resume moved, ship mode on USB, OTG as USB, stale waveform tail, standby mid-pattern, capacity written every boot): all eight mutants fail. Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>