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Alexey Zakharov
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* Add integration test docs, discussion guidelines, and edit contribution guide * Editorial changes to the integration test page * Test cases fixed * Backslashes removed * Fixes from ellyromanova * Update pull_request_template.md * Delete two issue templates * Remove notion of the forum * Update CODEOWNERS * Fix general_test_cases.md symbol * Fix general_test_cases.md again --------- Co-authored-by: Ruslan Nadyrshin <110516632+rnadyrshin@users.noreply.github.com> Co-authored-by: Štefan Croitoru <66339601+turbospok@users.noreply.github.com>
33 lines
1.3 KiB
Markdown
33 lines
1.3 KiB
Markdown
# Integration Tests
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> [!NOTE]
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> This guide is for Flipper Zero firmware repository maintainers.
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Manual integration test cases for Flipper Zero firmware, organized by subsystem and subsystem feature. Each Test Case page lists the steps to verify the corresponding functionality.
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## What to test
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Testing covers the **subsystem that changed.** You don't need to run every test case for every change.
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- **Test what changed, plus related regressions.** When you review changes in a subsystem, test the new behavior and re-run a few existing cases for that subsystem (using the steps in the test cases below) to confirm nothing broke. For example, when adding a new Sub-GHz protocol, test the new protocol and some of the existing ones.
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- **Skip unrelated subsystems.** There's no point testing NFC when only Sub-GHz was changed.
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- **Test everything for core-wide changes.** If a change affects something global, run all the test cases in order.
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## When to test
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- Before accepting new pull requests.
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- Before a release candidate.
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## Test cases
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- [General](general_test_cases.md)
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- [BadUSB](badusb_test_cases.md)
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- [CLI](cli_test_cases.md)
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- [GoodFAPs](goodfaps_test_cases.md)
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- [GPIO](gpio_test_cases.md)
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- [iButton](ibutton_test_cases.md)
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- [Infrared](infrared_test_cases.md)
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- [NFC](nfc_test_cases.md)
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- [RFID](rfid_test_cases.md)
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- [Sub-GHz](subghz_test_cases.md)
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